发明名称 Method for fabricating a nonvolatile semiconductor memory cell
摘要 A method for producing a nonvolatile semiconductor memory cell, that includes producing a floating gate in a self-aligning manner using standard processes. The use of TiO2 or WOx as the dielectric layer between the control gate and the floating gate results in a sufficiently high capacitive coupling factor, so that it is possible to fabricate a semiconductor memory cell of very small dimensions.
申请公布号 US2002098648(A1) 申请公布日期 2002.07.25
申请号 US20020013264 申请日期 2002.04.04
申请人 LUDWIG CHRISTOPH;SCHREMS MARTIN 发明人 LUDWIG CHRISTOPH;SCHREMS MARTIN
分类号 H01L21/28;H01L21/8247;H01L29/788;(IPC1-7):H01L21/336 主分类号 H01L21/28
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