发明名称 |
Method for fabricating a nonvolatile semiconductor memory cell |
摘要 |
A method for producing a nonvolatile semiconductor memory cell, that includes producing a floating gate in a self-aligning manner using standard processes. The use of TiO2 or WOx as the dielectric layer between the control gate and the floating gate results in a sufficiently high capacitive coupling factor, so that it is possible to fabricate a semiconductor memory cell of very small dimensions.
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申请公布号 |
US2002098648(A1) |
申请公布日期 |
2002.07.25 |
申请号 |
US20020013264 |
申请日期 |
2002.04.04 |
申请人 |
LUDWIG CHRISTOPH;SCHREMS MARTIN |
发明人 |
LUDWIG CHRISTOPH;SCHREMS MARTIN |
分类号 |
H01L21/28;H01L21/8247;H01L29/788;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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