| 摘要 |
<p>A calibration system is provided for calibrating a sensor with respect to an external reference frame associated with manufacturing gauging station (200). A target calibration device (600) is positioned at a vantage point to detect and calibrate its reference frame in relation to the external reference frame. A reference target having at least three non-coplanar reflective surfaces (406) is illuminated by the structured light emanating from the sensor. In this way, the calibration system is able to determine the spatial location and orientation of the reference target in relation to the sensor. The calibration system further includes a coordinate transformation system for coordinating the measurement data from the target calibration device and from the feature sensor (240), whereby the feature sensor (240) is calibrated with respect to the external reference frame.</p> |
