| 摘要 |
A sample extrusion device 12 for sequentially extruding a sample 1 in a predetermined direction, a sample cutting device 14 for sequentially cutting the extruded sample, and a con-focal image pickup device 16 for focusing an illuminating light at a section portion that was cut to pick up two-dimensional images of the cut section from a reflected light thereof are provided to reconstruct an internal structure of the sample from many two-dimensional images (continuous section images) that differ in the cutting positions. The sample can be continuously cut to continuously observe the sectional images thereof under no influence of the sample being seen transparently, the entirety of the sample can be observed in almost the same condition even though the sample is colored with a fluorescent dye, and thereby, the internal structure of the sample can be reconstructed with a high precision.
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