发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE, THE SEMICONDUCTOR SUBSTRATE, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPLIANCE
摘要 <p>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor substrate, whereby a single-crystal semiconductor substrate having different thicknesses from each other corresponding to its portions can be formed, in the semiconductor substrate of SOI structure. SOLUTION: The manufacturing method of the semiconductor substrate includes a process for forming an insulation film 2 on a single-crystal semiconductor substrate 1, a process for providing an ion-shielding material 3 on the insulation film 2, a process for implanting ions into the semiconductor substrate 1 from the side of the insulation film 2 to form ion-implanted layers 1a, 1b a process for bonding the semiconductor substrate 1 to a support substrate 5, and a process for peeling off the semiconductor substrate 1 therefrom, to leave the ion-implanted layers 1a, 1b as they are.</p>
申请公布号 JP2002124652(A) 申请公布日期 2002.04.26
申请号 JP20000315822 申请日期 2000.10.16
申请人 SEIKO EPSON CORP 发明人 YAMAZAKI YASUSHI;HIRABAYASHI YUKIYA
分类号 G02F1/1333;G02F1/136;G02F1/1368;G09F9/00;G09F9/30;H01L21/02;H01L21/336;H01L21/762;H01L21/77;H01L21/84;H01L27/12;H01L29/786;(IPC1-7):H01L27/12;G02F1/133 主分类号 G02F1/1333
代理机构 代理人
主权项
地址