发明名称 |
Source synchronous link integrity validation |
摘要 |
A system may perform interconnect BIST (IBIST) testing on source synchronous links. The system may perform, at normal operating frequency, a source synchronous link test that tests a victim line on the source synchronous link using a transition weave pattern. The transition weave pattern causes interaction between a data transition on the victim line, previous transitions on the victim line, and transitions on the other lines of the link (the "aggressor" lines). The interaction caused may be: (i) a first crossing pulse on the victim line; (ii) a second crossing pulse of the opposite polarity on each aggressor line concurrent with the first crossing pulse on the victim line; and (iii) a reflection in the opposite direction of the first transition of the first crossing pulse, wherein the reflection results from a previous transition on the victim line. |
申请公布号 |
WO0184170(A3) |
申请公布日期 |
2002.04.25 |
申请号 |
WO2001US14477 |
申请日期 |
2001.05.03 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
SMITH, BRIAN, L.;CHAKRABARTI, PRABHANSU |
分类号 |
G01R31/3185;G06F11/267;H04L1/24 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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