| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device which is provided with a means to detect a change in an element related to a calibrating operation and in which a calibration control operation related to the replacement of a board can be performed precisely. SOLUTION: The semiconductor testing device which is equipped with a function to calibrate the semiconductor testing device itself is provided with an ID giving means by which a board ID capable of discriminating individual boards with reference to the individual boards related to at least the calibrating operation is given to the boards, a board-slot-position control means which controls slot position information on the boards on which the individual boards equipped with the board ID are mounted and a calibration-execution control means by which whether a system initializing operation or a timing calibrating operation can be executed or not for every board is determined on the basis of the board ID giving means and the slot-position control means and which executes the calibrating operation to the board as an object based on its determination.
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