发明名称 CARTRIDGE SYSTEM FOR A PROBING HEAD FOR AN ELECTRICAL TEST PROBE
摘要 <p>A cartridge system (20) includes a main probing head body (24) with electronics (28) positioned therein. Further, the cartridge system (20) includes a probing tip cartridge (26) having a probing tip (30). An electrical contact mechanism (32) electrically couples the electronics (28) to the probing tip (30) when the probing tip cartridge (26) is in mating relationship with the main probing head body (24). The tip may be, for example, a pointed tip, a socket tip, or a grabber tip.</p>
申请公布号 WO2002011244(A1) 申请公布日期 2002.02.07
申请号 US2001024163 申请日期 2001.07.31
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