发明名称 |
INSPECTION CHIP FOR SENSOR MEASURING INSTRUMENT |
摘要 |
<p>A check chip of the present invention employed at a usage of a sensor measuring device is provided with a structural characterizing portion of a convex shape, concave shape or a penetration hole at a location, by which a user is considered to pick up, and the state of the structural characterizing portion is made to be different from that of a structural characterizing portion provided on a correction chip which is similar to the check chip, in a size, the number of the structural characterizing portions, or placement location. According to the check chip constructed as above, the difference from the correction chip can be easily identified even by a visually handicapped person or a weak-sighted person, according to the difference in the structural characterizing portion, from the touch, thereby preventing the person from using the check chip and the correction chip with confused. <IMAGE></p> |
申请公布号 |
EP1172653(A1) |
申请公布日期 |
2002.01.16 |
申请号 |
EP20010904531 |
申请日期 |
2001.02.19 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;ARKRAY, INC. |
发明人 |
SATO, YOSHIHARU;KOIKE, MASUFUMI;KAWAMATA, YASUHITO;TOKUNO, YOSHINOBU |
分类号 |
G01N33/483;G01D18/00;G01N27/28;G01N33/48;G01N35/00;G01N37/00;(IPC1-7):G01N33/48 |
主分类号 |
G01N33/483 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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