发明名称 INDUCTIVE COUPLING PLASMA SPECTRUM ANALYZER
摘要 PROBLEM TO BE SOLVED: To achieve less wear in a rotating mechanism for a diffraction grating of a spectrograph for an inductive coupling plasma spectrum analyzer by sliding a contact mounted at the end of a sine bar in smooth contact with a knife edge. SOLUTION: In the rotating mechanism for the diffraction grating 1 of the spectrograph for the inductive coupling plasma spectrum analyzer, the contact surface of the contact 4 with the sine bar 3 is in the form of contact at a point on a curved face.
申请公布号 JP2001349780(A) 申请公布日期 2001.12.21
申请号 JP20000173853 申请日期 2000.06.09
申请人 SEIKO INSTRUMENTS INC 发明人 NAKANO NOBUO;HARADA YOICHI;TAKAGI YASUYUKI;KIHARA HIROYUKI;MATSUDA TAKAKIMI
分类号 G01J3/06;G01J3/18;G01N21/73;(IPC1-7):G01J3/06 主分类号 G01J3/06
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