发明名称 |
INDUCTIVE COUPLING PLASMA SPECTRUM ANALYZER |
摘要 |
PROBLEM TO BE SOLVED: To achieve less wear in a rotating mechanism for a diffraction grating of a spectrograph for an inductive coupling plasma spectrum analyzer by sliding a contact mounted at the end of a sine bar in smooth contact with a knife edge. SOLUTION: In the rotating mechanism for the diffraction grating 1 of the spectrograph for the inductive coupling plasma spectrum analyzer, the contact surface of the contact 4 with the sine bar 3 is in the form of contact at a point on a curved face.
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申请公布号 |
JP2001349780(A) |
申请公布日期 |
2001.12.21 |
申请号 |
JP20000173853 |
申请日期 |
2000.06.09 |
申请人 |
SEIKO INSTRUMENTS INC |
发明人 |
NAKANO NOBUO;HARADA YOICHI;TAKAGI YASUYUKI;KIHARA HIROYUKI;MATSUDA TAKAKIMI |
分类号 |
G01J3/06;G01J3/18;G01N21/73;(IPC1-7):G01J3/06 |
主分类号 |
G01J3/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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