发明名称 ELECTROLYTIC GRINDING METHOD IN PREPARATION OF SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE AND APPARATUS UTILIZING THE SAME
摘要 PROBLEM TO BE SOLVED: To prevent the formation of deposits on the surface of a sample. SOLUTION: In an electrolytic grinding apparatus equipped with a sample 2 for a transmission electron microscope, the electrodes 3 opposed to the sample 2, a grinding fluid supply means 5 for supplying a grinding fluid 4 to the gaps between the sample 2 and the electrodes 3, an applying means 6 for applying voltage across the sample 2 and the electrodes 3 to grind the sample 2 and a detection means 7 for detecting that the sample 2 becomes predetermined thickness by grinding to stop the grinding fluid supply means 5 and the applying means 6, a bias voltage applying means 8 for applying bias voltage across the sample 2 and the electrodes 3 immediately after the detection means 7 detects that the sample 2 becomes predetermined thickness and a washing liquid supply means 10 for supplying a cleaning fluid 9 to the sample 2 immediately after detection to wash the same are provided.
申请公布号 JP2001337012(A) 申请公布日期 2001.12.07
申请号 JP20000158998 申请日期 2000.05.29
申请人 CENTRAL RES INST OF ELECTRIC POWER IND 发明人 DOI KENJI;SONETA NAOKI;ISHINO SHIORI
分类号 G01N1/34;C25F3/16;G01N1/28;G01N1/32;(IPC1-7):G01N1/34 主分类号 G01N1/34
代理机构 代理人
主权项
地址