发明名称 Charged particle beam apparatus and method for operating the same
摘要 A method of irradiation with a charged particle beam and an irradiation apparatus wherein the charged particle beam supplied from an accelerator and extracted from the irradiation apparatus. The irradiation apparatus includes an electromagnet for scanning with the charged particle beam. The method includes the steps of stopping the extraction of the charged particle beam from the irradiation apparatus, changing an irradiation point of the charged particle beam by controlling the electromagnet under a condition when the extraction is stopped, and resuming the extraction of the charged particle beam from the irradiation apparatus after changing the irradiation point.
申请公布号 US6316776(B1) 申请公布日期 2001.11.13
申请号 US19990388437 申请日期 1999.09.02
申请人 HITACHI, LTD. 发明人 HIRAMOTO KAZUO;AKIYAMA HIROSHI;MATSUDA KOJI;NORIMINE TETSURO;TADOKORO MASAHIRO
分类号 G21K5/04;A61N5/10;H05G2/00;(IPC1-7):H05H9/00 主分类号 G21K5/04
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