| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a defective sense amplifier and a defective memory cell having no capability with respect to write-recovery time tDPL cannot be detected easily. SOLUTION: This device is provided with plural memory cells arranged in a matrix state, and word lines selecting one row out of plural memory cells, and defective sense amplifier and a defective memory cell having no capability for a recovery time tDPL are detected by quickening non-selection timing of a word line at the time of a test.
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