| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for conducting a production test considering failure by the effect of cross talk and make the production test pattern considering the failure by the effect of cross talk with a minimum number of patterns. SOLUTION: A net list 1 fulfilling a logic function is input, a scan path test structure is installed (S1) and the net list is layout in a mask pattern (S2). Danger locations apt to be affected by the cross talk in the layout are extracted (S3) and to the extracted danger locations, test circuits are added (S4) to form test patterns apt to be affected by the cross talk with a gate delay ATPG. A production test is conducted (S6, 7) by using the test pattern produced by applying the gate delay ATPG (S5) on the circuit.
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