发明名称 METHOD AND SYSTEM FOR SUPPORTING VERIFICATION OF IMPROVEMENT EFFECT OF PRODUCT
摘要 <p>PROBLEM TO BE SOLVED: To provide a technique for verifying the effect of countermeasure for failure. SOLUTION: This system is provided with a defective phenomenon frequency calculating means 3100 for obtaining the manufacture number of a product corresponding to a certain defective phenomenon from information 221 showing the defective phenomenon corresponding to a manufacture number stored in a repair management system, obtaining the manufacture date of the product equivalent to the defective phenomenon while referring to data 121 showing the corresponding relation of the manufacture number and the manufacture date stored in a manufacture management system based on the manufacture number and obtaining the frequency of the defective phenomenons for every manufacture date, and a transition information generating means 3200 for generating information showing the transition of the level of the generation of the specific defective phenomenon accompanying the lapse of the manufacture date based on the calculated frequency of the defective phenomenons.</p>
申请公布号 JP2001296918(A) 申请公布日期 2001.10.26
申请号 JP20000111138 申请日期 2000.04.12
申请人 SEIKO EPSON CORP 发明人 OKUHARA KOICHI
分类号 G06Q50/04;G05B23/02;G06F17/30;G06Q50/00;(IPC1-7):G05B23/02;G06F17/60 主分类号 G06Q50/04
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