发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To realize a channel concentration profile of a pMOSFET having a metal gate electrode structure and a buried channel structure as desired. SOLUTION: The p channel MOSFET comprises a channel region having the channel profile of the buried channel structure having a source and drain region 13 and counter layer formed in a semiconductor layer 11, gate insulation film 17 formed on the channel region, and metal gate electrode 18 wherein a metal whose work function value is near the center of the band gap of silicon is used at least in a part on the gate insulation side, The nitrogen concentration in the gate insulation film is not less than 2%.
申请公布号 JP2001284580(A) 申请公布日期 2001.10.12
申请号 JP20000090059 申请日期 2000.03.29
申请人 TOSHIBA CORP 发明人 AZUMA ATSUSHI;MORIFUJI EIJI
分类号 H01L21/283;H01L21/8238;H01L27/092;H01L29/78;(IPC1-7):H01L29/78;H01L21/823 主分类号 H01L21/283
代理机构 代理人
主权项
地址