| 摘要 |
In the substrate test method of, a first test circuit is connected to an array substrate, and a signal for turning on all the thin film transistors arranged on the array substrate is supplied to a scanning line driving circuit. Also, a predetermined voltage is applied to a signal line driving circuit through signal lines so as to supply a predetermined voltage to a storage capacitor electrode. Under this condition, a high voltage sufficient for forming a potential difference higher than that in the stage of forming a storage capacitor is applied to the storage capacitor line.
|
