发明名称 Method for high density plasma chemical vapor deposition of dielectric films
摘要 A plasma processing system for processes such as chemical vapor deposition includes a plasma processing chamber, a substrate holder for supporting a substrate within the processing chamber, a dielectric member having an interior surface facing the substrate holder, the dielectric member forming a wall of the processing chamber a gas supply for supplying gas to the chamber, directed towards the substrate, and an RF energy source such as a planar coil which inductively couples RF energy through the dielectric member and into the chamber to energize the process gas into a plasma state. The gas supply may comprise a primary gas ring and a secondary gas ring for supplying gases or gas mixtures into the chamber. The gas supply may further include injectors attached to the primary gas ring which inject gas into the chamber, directed toward the substrate. The plasma processing system may also include a cooling mechanism for cooling the primary gas ring during processing.
申请公布号 US6270862(B1) 申请公布日期 2001.08.07
申请号 US19990359639 申请日期 1999.07.26
申请人 LAM RESEARCH CORPORATION 发明人 MCMILLIN BRIAN;NGUYEN HUONG;BARNES MICHAEL;BERNEY BUTCH
分类号 C23C16/50;C23C16/44;C23C16/455;C23C16/507;C30B25/10;C30B25/14;H01J37/32;H01L21/205;(IPC1-7):H05H1/24 主分类号 C23C16/50
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