发明名称 Electronic interconnect structure and method for manufacturing it
摘要 A process for manufacturing an electronic interconnect structure, the process including the steps of depositing an adhesion metal layer over a dielectric material surface having at least one exposed aluminum surface; depositing a barrier metal layer over the adhesion metal layer; depositing a first layer of aluminum over the barrier metal layer; depositing an intermediate barrier metal layer over the first layer of aluminum; applying a photoresist layer on top of the intermediate barrier metal layer; exposing and developing the photoresist layer; removing the exposed barrier metal and photoresist layer, leaving a layer of barrier metal over the aluminum layer; converting those portions of the layer of aluminum which are not covered by barrier metal to a porous aluminum oxide by porous anodization; removing the porous aluminum oxide; and removing the exposed barrier metal and adhesion metal layers to leave exposed patterned aluminum, and an electronic interconnect structure manufactured by this method.
申请公布号 US6262478(B1) 申请公布日期 2001.07.17
申请号 US19990310328 申请日期 1999.05.12
申请人 AMITEC-ADVANCED MULTILAYER INTERCONNECT TECHNOLOGIES LTD. 发明人 HURWITZ DROR;IGNER EVA;YOFIS BORIS;KATZ DROR
分类号 H01L21/768;H01L23/532;H01L23/538;(IPC1-7):H01L23/053 主分类号 H01L21/768
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