发明名称 Method and apparatus for supporting a polishing pad during chemical-mechanical planarization of microelectronic substrates
摘要 A method and apparatus for planarizing a microelectronic substrate. In one embodiment, the apparatus can include an elongated polishing pad that is moved over a platen either between or during the planarization cycles, and a support pad that is moved along with the polishing pad. The support pad can be an elongated member that extends between a supply roller and a take-up roller, or can include a continuous member that extends around the spaced apart rollers. The platen can also be movable along with the support pad and can be supported by fluid jets, rollers, or a rotating bladder. Cleaning devices and/or milling devices can treat the surfaces of the polishing pad, the support pad and/or the platen to reduce the likelihood for contaminants to become caught between these components as they engage with each other.
申请公布号 US2001006878(A1) 申请公布日期 2001.07.05
申请号 US20010795263 申请日期 2001.02.27
申请人 WALKER MICHAEL A.;ROBINSON KARL M. 发明人 WALKER MICHAEL A.;ROBINSON KARL M.
分类号 B24B21/04;B24B37/04;B24D11/00;(IPC1-7):B24B21/04;B24B21/06 主分类号 B24B21/04
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