| 摘要 |
PROBLEM TO BE SOLVED: To decrease the number of pins required for a test, to enable a test by an inexpensive tester or a simultaneous test of many chips, and to short a test time. SOLUTION: This device is constituted so that an address for block selection selecting plural blocks of a cell array 1 alternatively and successively is generated using a binary counter 14 being cascade-connected conforming to an address for block selection for a single test.
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