发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To obtain a silicon film which is excellent in crystallinity and controlled in the direction of crystal growth and to form a semiconductor device by the use of the above silicon film. SOLUTION: A metal element (e.g. nickel element) which selectively promotes the crystallization of an amorphous silicon film is introduced into an amorphous silicon film formed on a glass substrate. Then, the glass substrate is subjected to a thermal treatment, by which a crystal growth starts taking place from a region where metal element is introduced in a direction in parallel with the lengthwise direction of the substrate. The crystal growth happens in a (111) direction. The substrate is lower in conductivity in a (111) axial direction than the other directions. A device is so formed as to enable carriers to move in the direction of crystal growth, by which the device of high electric properties can be obtained.
申请公布号 JP2001057339(A) 申请公布日期 2001.02.27
申请号 JP20000207632 申请日期 2000.07.10
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 OTANI HISASHI;TAKEYAMA JUNICHI;CHO KOYU;TAKAYAMA TORU;TAKEMURA YASUHIKO;MIYANAGA SHOJI
分类号 C30B29/06;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 C30B29/06
代理机构 代理人
主权项
地址