发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To obtain a silicon film which is excellent in crystallinity and controlled in the direction of crystal growth and to form a semiconductor device by the use of the above silicon film. SOLUTION: A metal element (e.g. nickel element) which selectively promotes the crystallization of an amorphous silicon film is introduced into an amorphous silicon film formed on a glass substrate. Then, the glass substrate is subjected to a thermal treatment, by which a crystal growth starts taking place from a region where metal element is introduced in a direction in parallel with the lengthwise direction of the substrate. The crystal growth happens in a (111) direction. The substrate is lower in conductivity in a (111) axial direction than the other directions. A device is so formed as to enable carriers to move in the direction of crystal growth, by which the device of high electric properties can be obtained. |
申请公布号 |
JP2001057339(A) |
申请公布日期 |
2001.02.27 |
申请号 |
JP20000207632 |
申请日期 |
2000.07.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
OTANI HISASHI;TAKEYAMA JUNICHI;CHO KOYU;TAKAYAMA TORU;TAKEMURA YASUHIKO;MIYANAGA SHOJI |
分类号 |
C30B29/06;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 |
主分类号 |
C30B29/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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