发明名称 |
METHOD FOR FABRICATING MOS TRANSISTOR |
摘要 |
PURPOSE: A method for fabricating a MOS transistor is provided which can block the diffusion of a boron ion in case of implanting the boron ion to form a source/drain of the MOS transistor. CONSTITUTION: A method for fabricating a MOS transistor prevents the generation of short channel effect, by preventing an impurity implanted to form a source/drain from being diffused to the bottom substrate region of a gate, by including the steps of: forming a gate on top of a substrate(1) where an isolation region is defined by the formation of a field oxide(3); forming a lightly doped source/drain(4) on the bottom of the side substrate through an impurity ion implantation process; forming a side wall(5) on the side of the gate and then forming a heavily doped source/drain(6) on the bottom of the side substrate of the side wall through impurity ion implantation process; and forming a diffusion-resistant layer(7) on the bottom substrate region of the lightly doped source/drain through impurity ion implantation process.
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申请公布号 |
KR20000041139(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980056922 |
申请日期 |
1998.12.21 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
HONG, SUNG KWUN;HWANG, JUNG MO |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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主权项 |
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地址 |
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