| 摘要 |
PROBLEM TO BE SOLVED: To increase the inspection efficiency of a semiconductor integrated circuit having an incorporated BIST circuit self-inspecting a memory part in a chip by making possible a check in arbitrary timing, without monitoring the pass/fail decision on the memory part all the times. SOLUTION: A BIST circuit 2, which self-inspects the quality of a memory part 1 operating in synchronism with an external clock, is equipped with an address generator 4 for memory part access, a is equipped with an address generator 4 for memory part access, a data generator 6 which generates self- inspection data, and a memory control signal generator 8 for memory part control, and equipped with a comparison circuit, which compares the pattern of the self-inspection data read out of the memory part with a previously set prescribed data pattern, to decide whether the both match each other and outputs a pass/fail flag signal as the decision result an a decision storage circuit 40 which stores the pass/fail flag signal outputted by the comparing circuit 10.
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