发明名称 HIGH PERFORMANCE MOS TRANSISTOR AND MANUFACTURING METHOD FOR THE MOS TRANSISTOR
摘要 PURPOSE: A high performance MOS(metal oxide semiconductor) transistor and manufacturing method for the MOS transistor are provided to prevent the short channel effect and to reduce the junction capacitance of source/drain areas. CONSTITUTION: A high performance MOS transistor comprises a first conductive type well region(7a), a gate oxide film(13), a gate electrode(15), a second conductive type high density source/drain area(21), and a second conductive type low density source/drain area(7a). The gate electrode is formed on the gate oxide film formed on the well region. The second source/drain area is inserted between the bottom of the first source/drain area and the well region and is doped with lower density than that of the first area.
申请公布号 KR20000020377(A) 申请公布日期 2000.04.15
申请号 KR19980038981 申请日期 1998.09.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JU YOUNG;KIM, YOUNG OK;YIM, HOON;NA, JONG JIN;KIM, BYUNG CHEOL
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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