发明名称 |
HIGH PERFORMANCE MOS TRANSISTOR AND MANUFACTURING METHOD FOR THE MOS TRANSISTOR |
摘要 |
PURPOSE: A high performance MOS(metal oxide semiconductor) transistor and manufacturing method for the MOS transistor are provided to prevent the short channel effect and to reduce the junction capacitance of source/drain areas. CONSTITUTION: A high performance MOS transistor comprises a first conductive type well region(7a), a gate oxide film(13), a gate electrode(15), a second conductive type high density source/drain area(21), and a second conductive type low density source/drain area(7a). The gate electrode is formed on the gate oxide film formed on the well region. The second source/drain area is inserted between the bottom of the first source/drain area and the well region and is doped with lower density than that of the first area.
|
申请公布号 |
KR20000020377(A) |
申请公布日期 |
2000.04.15 |
申请号 |
KR19980038981 |
申请日期 |
1998.09.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JU YOUNG;KIM, YOUNG OK;YIM, HOON;NA, JONG JIN;KIM, BYUNG CHEOL |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|