CONTACT PIN OF SEMICONDUCTOR PACKAGE TESTING SOCKET,申请号KR19960045980U-传众专利搜索

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发明名称	CONTACT PIN OF SEMICONDUCTOR PACKAGE TESTING SOCKET
摘要
申请公布号	KR200169516(Y1)	申请公布日期	2000.02.01
申请号	KR19960045980U	申请日期	1996.12.06
申请人	HYUNDAI MICRO ELECTRONICS CO.,LTD.	发明人	LEE, BYUNG HO
分类号	H01R33/76	主分类号	H01R33/76
代理机构		代理人
主权项
地址

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