发明名称 SEMICONDUCTOR DEVICE HAVING SPACER AND ANTI-REFLECTIVE CAP AND METHOD THEREOF AND METHOD FOR MANUFACTURING PHOTORESIST USING THEM
摘要 PURPOSE: A semiconductor device is provided to prevent effectively reflection of light from a reflective pattern. CONSTITUTION: The semiconductor device comprises: a semiconductor substrate(100); a reflective pattern(104p, 106p) formed on the semiconductor device; an anti-reflective cap(110p) formed on the reflective pattern; and an anti-reflective spacer(130s) formed on a side wall of the reflective pattern. The anti-reflective cap(110p) functions as a interference type anti-reflective film reducing below 20% a reflection ratio by offsetting a reflection light reflected from the reflective pattern surface and a light reflected from the anti-reflective cap surface out of a light input from an upper area of the anti-reflective cap.
申请公布号 KR20000003724(A) 申请公布日期 2000.01.25
申请号 KR19980024994 申请日期 1998.06.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, IN SUNG;LEE, JOONG HYUN;CHO, HAN GOO
分类号 H01L21/027;G03F7/11;H01L21/28;H01L21/768;H01L31/0232;(IPC1-7):H01L21/027 主分类号 H01L21/027
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