发明名称 |
SEMICONDUCTOR DEVICE HAVING SPACER AND ANTI-REFLECTIVE CAP AND METHOD THEREOF AND METHOD FOR MANUFACTURING PHOTORESIST USING THEM |
摘要 |
PURPOSE: A semiconductor device is provided to prevent effectively reflection of light from a reflective pattern. CONSTITUTION: The semiconductor device comprises: a semiconductor substrate(100); a reflective pattern(104p, 106p) formed on the semiconductor device; an anti-reflective cap(110p) formed on the reflective pattern; and an anti-reflective spacer(130s) formed on a side wall of the reflective pattern. The anti-reflective cap(110p) functions as a interference type anti-reflective film reducing below 20% a reflection ratio by offsetting a reflection light reflected from the reflective pattern surface and a light reflected from the anti-reflective cap surface out of a light input from an upper area of the anti-reflective cap.
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申请公布号 |
KR20000003724(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980024994 |
申请日期 |
1998.06.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, IN SUNG;LEE, JOONG HYUN;CHO, HAN GOO |
分类号 |
H01L21/027;G03F7/11;H01L21/28;H01L21/768;H01L31/0232;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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