发明名称 |
METHOD FOR ADJUSTING A THRESHOLD VOLTAGE OF A FLASH MEMORY APPARATUS |
摘要 |
PURPOSE: A method for adjusting a threshold voltage of a flash memory apparatus is provided, which can adjust a threshold voltage of a reference cell which is provided to a flash memory apparatus. CONSTITUTION: A method for adjusting a threshold voltage of a flash memory apparatus comprises the steps of: (S102)(S104) providing a first and a second control voltages to a first and a second pads to program a threshold voltage of a reference cell to a certain target voltage; (S106) judging as whether the threshold voltage of the reference cell is identical to the target voltage; (S108)(S112) outputting a path signal when the threshold voltage of the reference cell is identical to the target voltage and setting the second control signal as the ground voltage level for preventing a reprogram operation of the reference cell. Therefore, an adjusting time of the threshold voltage of the reference cell can to be shortened because of a panel-test in a wafer process.
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申请公布号 |
KR20000003879(A) |
申请公布日期 |
2000.01.25 |
申请号 |
KR19980025179 |
申请日期 |
1998.06.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, SUNG DON;PARK, JONG MIN |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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