发明名称 SEMICONDUCTOR TESTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor testing device, capable of returning a peripheral circuit power source which is capable of dispensing with executing self-diagnosis program and a calibration when a protection circuit of the periphery circuit power source operates. SOLUTION: This testing device is provided with an AC controller 11 for converting an AC power supplied from the outside a DC voltage to output it, a first switch means SW2 receiving the DC voltage of the AC controller 11 and turning on/off whether or not to output it, a second switch means SW3 controlling the on/off of the first switch means, a peripheral circuit power source 13 provided with a control terminal receiving the output of the first switch means SW2 by an input and capable of turning on/off an output AC/DC converted without shielding the input, and a wiring circuit for making a short of the control terminal of the peripheral circuit power source, only in a state of loading a motherboard 21 on a test head 20.
申请公布号 JP2000009790(A) 申请公布日期 2000.01.14
申请号 JP19980174199 申请日期 1998.06.22
申请人 ADVANTEST CORP 发明人 WASHIZU SHINEI
分类号 G01R31/26;G01R31/28;(IPC1-7):G01R31/26 主分类号 G01R31/26
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