| 摘要 |
PROBLEM TO BE SOLVED: To enable a signal to be inputted to a device to be tested to be more efficiently generated in a semiconductor device tester to test semiconductor devices such as ICs. SOLUTION: Test signal generating and determining parts 30, 40, and 50 generate timing signals for generating test signals to be inputted to a semiconductor device (DUT) 10, which is an object of test, output the generated timing signals to DUT interface parts 60, 70, and 80, and output the generated timing signals to a multiplexer 20. The multiplexer 20 outputs the timing signals generated by the test signal generating and judging parts 30, 40, and 50 to the DUT interface parts 60, 70, and 80 which are not connected to the test signal generating and judging parts 30, 40, and 50 at need. The DUT interface parts 60, 70, and 80 switch the output values of test signals to be outputted to the DUT 10 in synchronization with the inputted timing signals.
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