MEMORY TEST PATTERN GENERATOR,申请号KR19960065733-传众专利搜索

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发明名称	MEMORY TEST PATTERN GENERATOR
摘要
申请公布号	KR100227789(B1)	申请公布日期	1999.11.01
申请号	KR19960065733	申请日期	1996.12.14
申请人	KOREA ELECTRONICS & TELECOMMUNICATIONS RESEARCH INSTITUTE	发明人	PARK, SEONG-JU;PARK, JONG-UK;KIM, BO-WOO
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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