发明名称 Semiconductor device production process especially for producing a conductive structure e.g. a silicide electrode or connection for a MOS transistor
摘要 A semiconductor device production process comprises treating a silicon layer (3) with an oxidizing chemical to form a thin silicon oxide layer (4) prior to forming a silicide layer (5). An Independent claim is also included for a semiconductor device produced by the above process or having the layers described above. Preferred Features: The oxidizing chemical comprises one or more of a sulfuric acid solution, a nitric acid solution, a hydrogen peroxide solution and ozone water, optionally combined with a non-oxidizing chemical such as ammonia solution.
申请公布号 DE19847641(A1) 申请公布日期 1999.09.02
申请号 DE1998147641 申请日期 1998.10.15
申请人 MITSUBISHI DENKI K.K. 发明人 OHMORI, TOSHIAKI
分类号 H01L21/28;H01L21/285;H01L21/321;H01L21/768;H01L23/485;H01L29/45;H01L29/49;H01L29/78;(IPC1-7):H01L21/28;H01L21/336 主分类号 H01L21/28
代理机构 代理人
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