SEMICONDUCTOR MEMORY DEVICE CAPABLE OF SIMULTANEOUSLY DESIGNATING MULTIBIT TEST MODE AND SPECIAL TEST MODE,申请号KR19960012835-传众专利搜索

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发明名称	SEMICONDUCTOR MEMORY DEVICE CAPABLE OF SIMULTANEOUSLY DESIGNATING MULTIBIT TEST MODE AND SPECIAL TEST MODE
摘要
申请公布号	KR0185724(B1)	申请公布日期	1999.04.15
申请号	KR19960012835	申请日期	1996.04.25
申请人	MITSUBISHI DENKI KK.	发明人	SUMA, KATSUHIRO
分类号	G06F12/16;G06F11/22;G11C11/401;G11C29/00;G11C29/14;G11C29/34;(IPC1-7):G11C29/00	主分类号	G06F12/16
代理机构		代理人
主权项
地址

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