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发明名称
THE TEST DEVICE FOR SEMICONDUCTOR CHIP PACKAGE
摘要
申请公布号
KR0145955(B1)
申请公布日期
1998.12.01
申请号
KR19950008339
申请日期
1995.04.11
申请人
SAMSUNG ELECTRONICS CO.,LTD
发明人
CHON, JE-SUK;CHOE, CHAN-HO;CHO, INN-SUB;SIM, WON-SUB
分类号
G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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