发明名称 Self-aligned method of micro-machining field emission display microtips
摘要 A method of fabricating electron emission structures 28 having enhanced emission characteristics. The method comprises the steps of providing a substrate 10 having electron emission structures 5 thereon and having a layer 5'' over the electron emission structures. The layer 5'' having apertures 30 in alignment with said electron emission structures 5. Then modifying the electron emission structures 5 through the apertures 30 with a directional ion milling beam; thereby creating modified electron emission structures 17,29 with enhanced emission efficiency.
申请公布号 US5836799(A) 申请公布日期 1998.11.17
申请号 US19960761587 申请日期 1996.12.06
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 LEVINE, JULES D.;VICKERS, KENNETH G.
分类号 H01J9/02;(IPC1-7):H01J9/02 主分类号 H01J9/02
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