| 摘要 |
PROBLEM TO BE SOLVED: To reduce a difference of a temperature characteristic between a detecting voltage and a reference voltage in the semiconductor device that incorporates a comparator where the detecting voltage is obtained from a detecting element integrated in a substrate and the reference voltage is obtained from an externally mounted reference element. SOLUTION: A temperature dependent semiconductor element is provided to either or the both of a detecting side circuit and a reference side circuit of a comparator 2 (a diode 9 is provided to the detecting side circuit and a resistive element 13 is provided to the reference side circuit). Even when the detecting voltage is fluctuated to a generated heat of a built-in power element 18, each temperature characteristic of the diode 9 and the resistive element 13 is acted to reduce a difference from each temperature characteristic of the detecting voltage and the reference voltage. |
