FUNCTION INSPECTION METHOD FOR ELECTRONIC APPARATUS

摘要

PROBLEM TO BE SOLVED: To markedly shorter the operating time of an inspection and to enhance the inspection accuracy and the reliability in the production process of an information apparatus product are by using a parallel inspection system instead of a serial inspection system. SOLUTION: A measuring device 2 by which the function inspection of a plurality of objects 3, to be inspected, is performed simultaneously by a multitask processing operation is used. A rotary base machine 1 is used in such a way that units 11 to 15 on which the objects 3 to be inspected are placed and which are provided with pin contacts 4 connected electrically to the measuring device 2 are arranged in a circular shape. The rotary base machine 1 is turned and moved sequentially in every unit, and a plurality of function inspections are executed stepwise and continuously without releasing the connection of the pin contacts 4.