| 摘要 |
PROBLEM TO BE SOLVED: To provide a stable, highly reliable device without changing an electric characteristic and a reliability characteristic by controlling operation voltage, operation current of circuits in a semiconductor device according to fluctuation in a manufacture condition and a use condition. SOLUTION: When an external input CE is inputted, memory operation is started, and an address input Ain is amplified by a buffer circuit AB to be supplied to drivers X-Dec, Y-Dec. Thus, when a piece of word line W is selected, an information charge stored in a Cs in a memory cell is outputted to a data line. A minute signal on the data line is amplified by an amplifier SA. A data line signal selected by a Y Dec & Driv. is outputted to I/O, I'/O, and is amplified by a main amplifier MA to be outputted to the outside as a Dout. Then, the control circuit 3 sends out outputs 5 suitable to respective circuits to be control objects according to the manufacture condition and use condition to control them. |
