发明名称 Impedance measuring apparatus
摘要 An impedance measuring apparatus for a device (10) is provided with a reference resistor part (20) and the relative error among measurement ranges is corrected automatically using the reference resistor. A single range is calibrated using a single impedance standard so that absolute calibration is carried out for all of the ranges. A signal normalizing part (60) is placed on the front section of an A-D converter (70) and another signal normalizing part (40) is placed on the front section of a frequency converter (52).
申请公布号 EP0802420(A2) 申请公布日期 1997.10.22
申请号 EP19970302511 申请日期 1997.04.11
申请人 HEWLETT-PACKARD COMPANY 发明人 WAKAMATSU, HIDEKI
分类号 G01R27/02;G01R35/00;(IPC1-7):G01R27/02 主分类号 G01R27/02
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