发明名称 AMORPHOUS SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve optical conductivity, optical stability and spectral sensitivity characteristic, by forming a layer made of specific i-type amorphous silicon on a base layer made of amorphous silicon with a specific content of chlorine, a specific optical gap and a specific porosity. SOLUTION: A base layer is composed of amorphous silicon with a chlorine content of 0.1-5.0atom%, an optical gap of 1.9-2.5eV and a porosity of 5.0-15vol%. One or more layers of i-type amorphous silicon with an optical gap smaller than that of the base layer, a chlorine content of 0.005-0.1atom%, an optical gap of an optical gap of 1.6-1.9eV and a porosity of 0.01-5.0vol%, are formed on the base layer. For the purpose, gas in plasma is supplied to a film formation chamber 1 from a connecting section. Material gas is supplied from a material gas feed port 7 with its flow rate adjusted by means of a flow rate regulator 8. The gases are mixed there. The mixed gas is brought into contact with a substrate 3 heated to a specific temperature by a heater 10, and an amorphous silicon film is thereby formed on the surface of the substrate.
申请公布号 JPH09275222(A) 申请公布日期 1997.10.21
申请号 JP19960083765 申请日期 1996.04.05
申请人 TOKUYAMA CORP 发明人 AZUMA MASANOBU
分类号 H01L27/146;H01L21/205;H01L31/04 主分类号 H01L27/146
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