发明名称 Low-loss, low-inductance interconnect for microcircuits
摘要 A low-loss, low-inductance metal interconnect for an electrical signal in a microcircuit comprises a plurality of spaced-apart generally parallel metal interconnect lines disposed in a plane over an insulating layer. The metal interconnect lines are interleaved with and electrically insulated from a plurality of spaced-apart generally parallel metal lines disposed in the plane. The metal interconnect lines together comprise a signal interconnect path, and the metal lines are coupled to a fixed voltage potential, such as ground.
申请公布号 US5675298(A) 申请公布日期 1997.10.07
申请号 US19950561339 申请日期 1995.11.21
申请人 SUN MICROSYSTEMS, INC. 发明人 BHAGWAN, RAGHUNAND;ROGERS, ALAN;MACDONALD, JOHN
分类号 H01L23/522;(IPC1-7):H01P3/08;H01P5/00 主分类号 H01L23/522
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