发明名称 |
Low-loss, low-inductance interconnect for microcircuits |
摘要 |
A low-loss, low-inductance metal interconnect for an electrical signal in a microcircuit comprises a plurality of spaced-apart generally parallel metal interconnect lines disposed in a plane over an insulating layer. The metal interconnect lines are interleaved with and electrically insulated from a plurality of spaced-apart generally parallel metal lines disposed in the plane. The metal interconnect lines together comprise a signal interconnect path, and the metal lines are coupled to a fixed voltage potential, such as ground.
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申请公布号 |
US5675298(A) |
申请公布日期 |
1997.10.07 |
申请号 |
US19950561339 |
申请日期 |
1995.11.21 |
申请人 |
SUN MICROSYSTEMS, INC. |
发明人 |
BHAGWAN, RAGHUNAND;ROGERS, ALAN;MACDONALD, JOHN |
分类号 |
H01L23/522;(IPC1-7):H01P3/08;H01P5/00 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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