发明名称 GRINDING METHOD OF SEMI-CONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a grinding method of a semi-conductor wafer capable of preventing the surface sagging generated on an outer circumferential part of the semi-conductor wafer, and grinding the semi-conductor wafer of excellent flatness. SOLUTION: A grinding block 1 comprises a ceramic plate 11, a backing pad 12, and a template 13. The backing pad 12 whose compressibility is larger than that of an abrasive cloth 2 is used. A semi-conductor wafer 3 is mounted on the grinding block 1. The semi-conductor wafer 3 is pressed against the abrasive cloth 2 for grinding.
申请公布号 JPH09234667(A) 申请公布日期 1997.09.09
申请号 JP19960084455 申请日期 1996.02.29
申请人 KOMATSU ELECTRON METALS CO LTD 发明人 YAMASHITA JUNICHI
分类号 B24B37/04;B24B37/30;H01L21/304 主分类号 B24B37/04
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