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经营范围
发明名称
SEMICONDUCTOR MEMORY AND TESTING METHOD THEREOF
摘要
申请公布号
JPH09198894(A)
申请公布日期
1997.07.31
申请号
JP19960006567
申请日期
1996.01.18
申请人
MITSUBISHI ELECTRIC CORP
发明人
SAGO YOSHINORI
分类号
G11C29/00;G11C29/14;(IPC1-7):G11C29/00
主分类号
G11C29/00
代理机构
代理人
主权项
地址
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