发明名称 |
SEMICONDUCTOR DEVICE & MANUFACTURING METHOD |
摘要 |
A semiconductor memory device using SOI includes a first semiconductor substrate, a plurality of semiconductor layers formed on the first semiconductor substrate and divided from one another by a first insulating layer, a conductive pattern formed on sidewalls of the semiconductor layers, a gate electrode of a transistor, which is formed on the semiconductor layers and serves as a word line, a first contact hole formed on the first insulating layer placed on the semiconductor layers through the back side of the substrate, and a capacitor formed on the semiconductor layers and connected to the conductive pattern through the first contact hole, through the back of the semiconductor substrate.
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申请公布号 |
KR970010683(B1) |
申请公布日期 |
1997.06.30 |
申请号 |
KR19930028224 |
申请日期 |
1993.12.17 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD |
发明人 |
LEE, BYUNG-HOON;LEE, YE-SEUNG;YU, SUN-ILL |
分类号 |
H01L27/12;(IPC1-7):H01L27/12 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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