发明名称 SEMICONDUCTOR DEVICE & MANUFACTURING METHOD
摘要 A semiconductor memory device using SOI includes a first semiconductor substrate, a plurality of semiconductor layers formed on the first semiconductor substrate and divided from one another by a first insulating layer, a conductive pattern formed on sidewalls of the semiconductor layers, a gate electrode of a transistor, which is formed on the semiconductor layers and serves as a word line, a first contact hole formed on the first insulating layer placed on the semiconductor layers through the back side of the substrate, and a capacitor formed on the semiconductor layers and connected to the conductive pattern through the first contact hole, through the back of the semiconductor substrate.
申请公布号 KR970010683(B1) 申请公布日期 1997.06.30
申请号 KR19930028224 申请日期 1993.12.17
申请人 SAMSUNG ELECTRONICS CO.,LTD 发明人 LEE, BYUNG-HOON;LEE, YE-SEUNG;YU, SUN-ILL
分类号 H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L27/12
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