发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device with reliability for a long time, by reducing shearing distortion caused at an end part of resin formed around a semiconductor element. SOLUTION: A semiconductor device 10 includes a circuit wiring board 2 and a semiconductor element 1 mounted on the board 2 with a bump electrode 3. A space between the board 2 and the semiconductor element 1 and a space around the semiconductor element 1 are sealed with a resin containing inorganic filler. The resin part includes a first resin 6 in a space surrounded with most outer bumps 3 in a circumferential part of the semiconductor element 1 and a second resin 7 in a space not surrounded with the most outer bumps 3. In addition, at least one index out of a containing ratio of inorganic filler, a maximum size of grain or a mean size of grain of the first resin 6 is made larger than that of the second resin 7.
申请公布号 JPH09172110(A) 申请公布日期 1997.06.30
申请号 JP19950333323 申请日期 1995.12.21
申请人 TOSHIBA CORP 发明人 TATEYAMA KAZUKI;YAMADA HIROSHI;HONMA SOICHI;TOGASAKI TAKASHI;SAITO MASAYUKI
分类号 H01L21/60;H01L21/56;H01L23/29;H01L23/31;(IPC1-7):H01L23/29 主分类号 H01L21/60
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