发明名称 Laterally diffused MOS transistor device having reduced surface field
摘要 The MOS transistor has a reduced surface field strength and includes an n-type semiconductor layer and a p-type trough formed in the layer. An n-type trough is formed in the initial trough and it contains a source region, a channel region, and a drain region. On the channel region is formed a gate electrode such that the p-type trough serves as a drift region. On voltage application, the MOS transistor is in non-active state. On application to the drain of a HV exceeding a preset value, a current path is formed. This path extends from the p-type trough over the n-type trough and the semiconductor layer.
申请公布号 DE19647324(A1) 申请公布日期 1997.05.22
申请号 DE1996147324 申请日期 1996.11.15
申请人 DENSO CORP., KARIYA, AICHI, JP 发明人 NAKAYAMA, YOSHIAKI, KARIYA, AICHI, JP;MAEDA, HIROSHI, KARIYA, AICHI, JP;IIDA, MAKIO, KARIYA, AICHI, JP;FUJIMOTO, HIROSHI, KARIYA, AICHI, JP;SAITOU, MITSUHIRO, KARIYA, AICHI, JP;IMAI, HIROSHI, KARIYA, AICHI, JP;BAN, HIROYUKI, KARIYA, AICHI, JP
分类号 H01L21/336;H01L29/739;H01L29/78 主分类号 H01L21/336
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