发明名称 SEMICONDUCTOR PRESSURE SENSOR AND PRODUCTION METHOD THEREOF
摘要 <p>The present invention relates to a semiconductor pressure sensor comprising a single crystal silicon substrate; a closed air gap chamber provided on the said single crystal silicon substrate, on which a measured diaphragm made by epitaxial growth is formed and which has a predetermined narrow gap backing up the application of over-pressure to the said diaphragm; and a strain detection element incorporated in the said measuring diaphragm. &lt;IMAGE&gt;</p>
申请公布号 EP0767501(A1) 申请公布日期 1997.04.09
申请号 EP19960907682 申请日期 1996.03.28
申请人 YOKOGAWA ELECTRIC CORPORATION 发明人 WATANABE, TETSUYA,;KUDO, TAKAHIRO;IKEDA, KYOICHI
分类号 G01L9/04;G01L9/00;G01L19/06;H01L29/84;(IPC1-7):H01L29/84 主分类号 G01L9/04
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