发明名称 |
SEMICONDUCTOR PRESSURE SENSOR AND PRODUCTION METHOD THEREOF |
摘要 |
<p>The present invention relates to a semiconductor pressure sensor comprising a single crystal silicon substrate; a closed air gap chamber provided on the said single crystal silicon substrate, on which a measured diaphragm made by epitaxial growth is formed and which has a predetermined narrow gap backing up the application of over-pressure to the said diaphragm; and a strain detection element incorporated in the said measuring diaphragm. <IMAGE></p> |
申请公布号 |
EP0767501(A1) |
申请公布日期 |
1997.04.09 |
申请号 |
EP19960907682 |
申请日期 |
1996.03.28 |
申请人 |
YOKOGAWA ELECTRIC CORPORATION |
发明人 |
WATANABE, TETSUYA,;KUDO, TAKAHIRO;IKEDA, KYOICHI |
分类号 |
G01L9/04;G01L9/00;G01L19/06;H01L29/84;(IPC1-7):H01L29/84 |
主分类号 |
G01L9/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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