发明名称 Foreign particle inspecting system
摘要 An inspecting system includes a light source, an irradiating optical system for irradiating a surface of an object such as a reticle or photomask with light from the light source, a detection optical system for detecting scattered light from the surface of the object, and a light blocking device provided substantially parallel to the surface of the object, the light blocking device having a first light transmitting portion for passing light coming from the light source toward the surface of the object and a second light transmitting portion for passing light coming from an irradiated position on the surface of the object toward the detection optical system.
申请公布号 US5585918(A) 申请公布日期 1996.12.17
申请号 US19950494539 申请日期 1995.06.26
申请人 CANON KABUSHIKI KAISHA 发明人 TAKEUCHI, SEIJI;MIYAZAKI, KYOICHI;TSUJI, TOSHIHIKO
分类号 G01N21/88;G01N21/94;G01N21/956;G03F1/00;G03F1/08;G03F1/14;H01L21/00;H01L21/027;(IPC1-7):H05B37/00 主分类号 G01N21/88
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