发明名称 |
Foreign particle inspecting system |
摘要 |
An inspecting system includes a light source, an irradiating optical system for irradiating a surface of an object such as a reticle or photomask with light from the light source, a detection optical system for detecting scattered light from the surface of the object, and a light blocking device provided substantially parallel to the surface of the object, the light blocking device having a first light transmitting portion for passing light coming from the light source toward the surface of the object and a second light transmitting portion for passing light coming from an irradiated position on the surface of the object toward the detection optical system.
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申请公布号 |
US5585918(A) |
申请公布日期 |
1996.12.17 |
申请号 |
US19950494539 |
申请日期 |
1995.06.26 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
TAKEUCHI, SEIJI;MIYAZAKI, KYOICHI;TSUJI, TOSHIHIKO |
分类号 |
G01N21/88;G01N21/94;G01N21/956;G03F1/00;G03F1/08;G03F1/14;H01L21/00;H01L21/027;(IPC1-7):H05B37/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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