发明名称 TEST METHOD AND TEST CIRCUIT
摘要 PURPOSE: To provide the test circuit of a simple and inexpensive laser diode drive circuit without using any laser diode and any photo-diode. CONSTITUTION: An emitter of a pnp transistor 5 allowing current to flow in response to applied voltage for a base is connected to a positive power source through a resistor 6. The collector of the transistor 5 is connected to the terminal A at the side of a light receiving element of a drive circuit, one terminal of a resistor 7 is coupled to the positive power source, the other terminal of the resistor 7 is connected to the base of the transistor 5 and the terminal B at the side of a light emitting element. A light emitting element drive circuit is tested by changing the resistor 6 or 7.
申请公布号 JPH08304508(A) 申请公布日期 1996.11.22
申请号 JP19950111596 申请日期 1995.05.10
申请人 OKI ELECTRIC IND CO LTD 发明人 TAKAHASHI NORIAKI;TAYA TAKASHI;YAMAOKA SHINSUKE;ODAGIRI HIDEAKI
分类号 G01R31/26;G01M11/00;G01R31/28;H01L33/00 主分类号 G01R31/26
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