Verfahren zur quantitativen Messung dünnschicht-chromatographisch getrennter Proben,申请号DE19893921845-传众专利搜索

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发明名称	Verfahren zur quantitativen Messung dünnschicht-chromatographisch getrennter Proben
摘要
申请公布号	DE3921845(C2)	申请公布日期	1996.09.12
申请号	DE19893921845	申请日期	1989.07.03
申请人	ADAM, OLAF, DR., 82343 POECKING, DE	发明人	ADAM, OLAF, DR., 82343 POECKING, DE
分类号	G01N27/447;G01N30/68;G01N30/84;G01N30/95;(IPC1-7):G01N30/90;B01D15/08;B23K26/00;G01N22/00;G01N31/12;H05B6/64	主分类号	G01N27/447
代理机构		代理人
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地址

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