Method and apparatus for testing integrated circuits,申请号IL19910106890-传众专利搜索

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发明名称	Method and apparatus for testing integrated circuits
摘要
申请公布号	IL106890(A)	申请公布日期	1996.06.18
申请号	IL19910106890	申请日期	1991.09.27
申请人	HUGHES AIRCRAFT COMPANY	发明人
分类号	(IPC1-7):G01K1/073;G01K31/00	主分类号	(IPC1-7):G01K1/073
代理机构		代理人
主权项
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